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CSME 2023/05
Volume 44 No.2
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109-119
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Simulation Model and Experimental Verification for Machining of a Horn-shaped Nanochannel
Zone-Ching Lina, Fang-jung Shioua, Yih-Lin Chengb, Yu-Song Wangb and Jun-Wei Wenb
aOpto-Mechatronics Technology Center (OMTC), National Taiwan University of Science and Technology, No.43, Keelung Rd., Sec.4, Da'an Dist., Taipei City 10607, Taiwan.
bDepartment of Mechanical Engineering, National Taiwan University of Science and Technology, No.43, Keelung Rd., Sec.4, Da'an Dist., Taipei City 10607, Taiwan.
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Abstract:
This study reveals the patent interpolation surface for investigating the patent data ecosystem with a dataset of 3,770 patents discretized into six patent clusters. The CRISP-DM model is used to manage the patent data mining process, from data preparation to modeling and evaluating, and to explore the patent data cluster within the same framework. Four independent and three dependent factors and their corresponding three levels are identified and will be used for further data processing. The Taguchi method is used to select the orthogonal array design OA9 (34) and reduce the number of cases required to investigate the patent data cluster. Using the orthogonal array design, only nine cases are performed instead of the possible 34, and the results are applied to structure the dataset of dependent factors. Three key dependent factors influence this patent interpolation surface: patent applications, patent assignees, and technological diversity. However, it is a difficult issue to interpolate the patent dataset using the first-order regression equation with three key dependent factors. In this case, the biharmonic interpolation method is used to interpolate irregulated patent data and create a patent interpolation surface. The patent interpolation surface is capable of interpolating the irregular data points of the dataset of six patent clusters and facilitating the analysis of the patent data ecosystem. To do so, the patent interpolation surface reveals the superposition of patent applications, patent assignees, and technological diversity to induce harmonics. As a result, harmonic traps are observed on the patent interpolation surface in conjunction with variations in patent applications, patent assignees, and technological diversity.
Finally, the patent interpolation surface is divided into zones 1–4, and the harmonic traps formed are associated with a decrease in patent applications, patent assignees, and technological diversity. The levels of the three harmonic traps in zones 2–4 are 0.8, 0.8, and 0.48, respectively.
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Keywords: horn-shaped nanochannel, atomic force microscopy, two-pass offset machining method
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*Corresponding author; e-mail: zclin@mail.ntust.edu.tw
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©
2023
CSME , ISSN 0257-9731
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